Always the right solution
Whether you want to characterize thin films, MEMS, bulk materials or multilayers, we offer the right solution to help you achieve reliable results in every application and under all conditions.
Combined with the PES measuring system, sample holders from aixACCT Systems are the benchmark for characterizing piezoelectric materials today.
Whether you want to characterize thin films, MEMS, bulk materials or multilayers, we offer the right solution to help you achieve reliable results in every application and under all conditions.