From simple to innovative
Whether you want to contact structures measuring less than 20 m in diameter, perform high-voltage and/or temperature-based measurements on thin films, or determine the inverse e31,f coefficient using the Kano/Muralt method, our range of sample holders for thin films and MEMS are the perfect match for your requirements. See for yourself.
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The basic contacting point is our base system for characterizing thin films.
It consists of an acrylic plate with a magnetic base for use with one of our measuring tip holders. A high-resolution microscope camera is available as an optional extra. This allows you to contact structures measuring less than 20 mm in diameter.
The optional cover with interlock system makes it possible to also use a HV amplifier. The maximum sample size is 8 inches.
Features
Easy to operate For sample sizes up to 8 inches Up to 4 positioners for 4-point measuring with RS module Up to 4 positioners for 4-point measuring with RS module Optional high-resolution microscope camera Easy to operate
For sample sizes up to 8 inches
Up to 4 positioners for 4-point measuring with RS module
Up to 4 positioners for 4-point measuring with RS module
Optional high-resolution microscope camera
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The TFSHU sample holder for electrical testing lets you perform high-voltage and/or temperature-based measurements on thin film samples.
These are essential for developing actuator or sensor materials. The heating unit is integrated in the sample holder, removing the need for an additional temperature chamber.
Features
Sample surface must be polished when measuring MEMS components Special adapter for measuring the indirect e31 ,f coefficient on sawn samples
Interlock protective circuit Sample contacting via two positioners Sample surface must be polished when measuring MEMS components
Special adapter for measuring the indirect e31 ,f coefficient on sawn samples
Interlock protective circuit
Sample contacting via two positioners
SPECIFICATIONS
Temperature max. 250°C (temperature measurement on sample) Sample thickness 0,1–10 mm Sample diameter max. 25 x 25 mm 2 (1” x 1”) Voltage max. 400 volts Temperature
max. 250°C (temperature measurement on sample)
Sample thickness
0,1–10 mm
Sample diameter
max. 25 x 25 mm 2 (1” x 1”)
Voltage
max. 400 volts
The laser unit for measuring MEMS structures can be expanded with a positioning system. Combined with an improved camera system, this allows you to precisely set up even tiny structures. An additional optional sample holder can be used to measure the inverse e31,f coefficient according to the Kano/Muralt method.
The temperature range can also be extended to up to 500°C and/or -100°C. This allows you to comprehensively characterize ferroelectric, high-temperature materials.
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The 4-point bending sample holder lets you experience the innovative prowess of aixACCT Systems. Its design makes it possible to generate homogeneous and defined mechanical stresses in the thin film.
The 4-point bending sample holder lets you experience the innovative prowess of aixACCT Systems. Its design makes it possible to generate homogeneous and defined mechanical stresses in the thin film.
This ensures precise measurement of the piezoelectric e31 ,f coefficient within defined conditions. It is also possible to electrically pole the sample with intermittent measurement of the e31 ,f coefficient. This can be useful if you wish to investigate the influence of varying poling conditions on sample performance.
In addition, the new integrated amplifier and switching unit lets you investigate fatigue with intermittent measurements of the e31 ,f coefficient, examine DC voltage dependencies and even perform h31 measurements. There is also a temperature option that enables temperature-based measurements.
Features
4-point bending sample holder with piezo actuator for force generation Fixture for laser system Easy contact to top and bottom electrode Automated switching between e31 ,fmeasurement and poling Measurement of electrical and mechanical fatigue Requires special sample geometry Special positioning tool for simple and precise sample alignment 4-point bending sample holder with piezo actuator for force generation
Fixture for laser system
Easy contact to top and bottom electrode
Automated switching between e31 ,fmeasurement and poling
Measurement of electrical and mechanical fatigue
Requires special sample geometry
Special positioning tool for simple and precise sample alignment
SPECIFICATIONS
Temperature range: room temperature up to max. 200°C Frequency range: from 10 mHZ Voltage: max. 400 V (for poling) Temperature range:
room temperature up to max. 200°C
Frequency range:
from 10 mHZ
Voltage:
max. 400 V (for poling)
For more features and details about our aix4PB sample holder, please refer to the product sheet: