The standard system in many cases
aixPES was our first system solution. That was two decades ago. In that time, we have developed many more customized systems. Many of these have become the standard system in a wide range of areas, thanks in part to their ability to be tailored to the respective materials and applications.
TF Analyzer as the central control element
One thing all systems have in common is the use of a TF Analyzer as the central control element. The individual components are fully compatible, allowing us to create sophisticated systems through modular design. For customers like you, this modularity and flexibility means we can tailor your systems precisely to your needs, with low costs and short development times.
Precise and intuitive
Our system solutions are often highly customized. Despite this, they never compromise on either precision or ease of use. And the market has noticed this, as many of our products have become the unofficial benchmark for characterizing ferro and piezoelectric materials.
Find out more about our system solutions for thin film, bulk, multilayer and much more:
For evaluating all kinds of sensors and actuators
From µN to kN, we offer the right measuring system for force-related measurements in every force range. Our aixCMA systems let you reliably measure mechanical properties like stiffness or the e-modulus of your device. You can also determine the blocking force curves for various excitation voltages.
Automated characterization in development and production
From material development to the finished device, aixSCAN systems help you perform automated measurements with a high degree of flexibility. Whether you need to test push buttons or bulk arrays for ultrasound sensors, we develop solutions tailored to your needs.
aixDBLI Research Line
Thin film characterization in research and preliminary development
The Research Line of our dual-beam laser interferometers lets you perform piezoelectric characterization on thin films, from 1 inch manually to 8 inches semi-automatically. You can also use our DBLIs to determine the d33 coefficient of clamped layers quickly, precisely and with a high degree of reproducibility.