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Groundbreaking developments since 1995
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Milestones

Our success story in the niche market for piezoelectric material measurement systems began in 1995. We developed a compensation method that made it possible for the first time to measure hysteresis on even very small structures such as ferroelectric storage materials.

This unique selling point laid the foundations for many more groundbreaking developments.

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    2020
    New TMC business unit: Tools, Measurement, Consulting
    After bringing Peter Mardilovich and his team on board, aixACCT adds consulting services for the entire thin-film process to its testing portfolio.
  • 2018
    Introduction of the first Polaron production tool
    Production system for automatic poling and QA on bulk and multilayers.
  • 2016
    First e31 measurement at wafer level
    Measurement principle enables non-destructive measurement of e31,f by measuring d33 on various pad sizes.
  • 2015
    e31,f expansion of the TFHSU according to Kanno/Muralt
    Measurement principle enables non-destructive measurement of e31,f by measuring d33 on various pad sizes.
  • 2014
    aixTNT – through nozzle test system
    Special system based on the ScanningPES for characterizing thin film print heads.
  • 2013
    PSHU Kryo
    Temperature range of our piezo sample holders extended to between -100°C and 600°C.
  • 2012
    Introduction of the TFHSU thin film sample holder unit
    Thin film measurement point for temperature-based ferroelectric characterization.
  • 2009
    aixDBLI Industrial Line
    Fully automatic DBLI with industrial prober and loader, as well as SECS-GEM for connection to higher-level production control systems.
  • 2007
    Introduction of CMA and PTTB
    Test system for characterizing piezoelectric multilayer actuators with defined preloading and dynamic force profiles.
  • 2006
    First double beam laser interferometer (DBLI)
    The first commercially available double beam laser interferometer enables fast and high-resolution measurement of d33,f on clamped thin films.
  • 2006
    4-point bending system (aix4PB)
    The first commercially available double beam laser interferometer enables fast and high-resolution measurement of d33,f on clamped thin films.
  • 2002
    First piezoelectric test system (PES)
    We developed the first measurement system for characterizing piezoelectric bulk materials, based on the TF Analyzer. It enables simultaneous measurements of polarization and displacement under strong electric fields.
  • 1999
    First Windows-based ferroelectric analyzer
    aixACCT becomes a limited company as a spin-off of the RWTH Aachen.
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    1995
    Foundation with government funding
    aixACCT is set up as part of the chair of Prof. Waser at RWTH Aachen.

You can find more information about the scientific milestones here: