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> Multilayer test bench (aixCMA)
> Piezoelectric Evaluation System (aixPES)
> Sample Holder
> 200 / 400 V Amplifier
> aixPlorer
> Resonance Analyzer
Thin Film & Memory Products
Piezoelectric Evaluation System (PES)

  Features

1. Supported hardware
  • Internal and external high voltage amplifier
    (100 V up to 10 kV)
  • Sample holder for bulk, multilayer, or thin film samples
  • Temperature controller and temperature chambers
  • Displacement sensors (e.g. laser interferometer, capacitive, or inductive)
  • External lock-in or impedance bridge
2. Measurements
  • Large signal electric polarization and displacement
    (uni- & bipolar)
  • Small signal capacitance, loss tangent, and piezocoefficient vs. uni- and bipolar DC bias voltage
  • Temperature dependent and pyroelectric measurement
  • Leakage current measurement
  • Fatigue measurement
  • Impedance measurement
  • User defined excitation signals
3. Software
  • Windows 2000/XP operating system
  • Remote access and script control via GPIB or Ethernet
  • Database connection via ODBC interface
  • Measurement data export to ASCII
  • Measurement data exchange with aixPlorer software and Resonance Analyzer
     
  Specifications

  • All components of the PES setup comply with part 15 of the FCC rules
  • Detailed specifications and overall performance are strongly dependent on the integrated single components
Piezoelectric Evaluation System
Main Page
Features / Specifications
Sample Measurement - "Polarization and Displacement"
Sample Measurement - "Capacitance and Piezocoefficient"
Sample Measurement - "Temperature dependent measurement"
Product Sheet/ Documentation (PDF)
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