|
|
 2006
- Unique and patented sample holder for thin film e31,f piezocoefficient measurements utilizing 4-point bending technique
2005
- Patent and implementation of a new dynamic leakage current compensation method (DLCC)
- DLCC is about 100 times faster than conventional static leakage compensation methods
2003
- World first measurements on single cell testing on wafer level after full integration on 32 MBit chain FeRAM
2002
- Sample holder for high voltage and high temperature application, suitable also for displacement measurements
- Double laser beam interferometer with a resolution < 1 Picometer
2001
- First published direct hysteresis measurement on 200 nm x 200 nm ferroelectric capacitor structures
- Hysteresis measurement at 1 MHz and 10 MHz by virtual ground testing of 1T1C memory cells
2000
- First direct hysteresis measurement on real FeRAM memory cell capacitor
1999
- Foundation of the aixACCT Systems GmbH
- Hysteresis measurement on pad sizes down to 1 μm x 1 μm
1998
- Fast pulse switching testing, equal in speed to real operation frequency of a FeRAM
1997
- Introduction of static hysteresis measurement
1994 - 1996
- Prototypes of RX and DR module of TF ANALYZER 2000 have been used in the DRAM DARPA project to evaluate the suitability of BST for high density memory application
1995
- Founded by government funding, assigned to the Chair of Prof. Waser at the RWTH University of Aachen
|
|
History of Innovations